发明名称 Conformal doping in 3D si structure using conformal dopant deposition
摘要 Embodiments described herein generally relate to doping of three dimensional (3D) structures on a substrate. In one embodiment, a conformal dopant containing film may be deposited over the 3D structures. Suitable dopants that may be incorporated in the film may include boron, phosphorous, and other suitable dopants. The film may be subsequently annealed to diffuse the dopants into the 3D structures.
申请公布号 US9640400(B1) 申请公布日期 2017.05.02
申请号 US201514961920 申请日期 2015.12.08
申请人 APPLIED MATERIALS, INC. 发明人 Cheng Rui;Mallick Abhijit Basu;Gandikota Srinivas;Manna Pramit
分类号 H01L21/336;H01L21/225;H01L29/66;H01L21/324;H01L21/02;H01L29/167 主分类号 H01L21/336
代理机构 Patterson + Sheridan, LLP 代理人 Patterson + Sheridan, LLP
主权项 1. A substrate processing method, comprising: depositing a conformal film consisting of boron, carbon, and nitrogen by a combination of a thermal chemical vapor deposition process and a plasma deposition process on a three dimensional structure formed on a substrate, wherein the three dimensional structure is a silicon containing FinFET device; and annealing the three dimensional structure and the film to diffuse the boron into the three dimensional structure to dope the FinFET device.
地址 Santa Clara CA US