发明名称 Systems and methods for flaw scan with interleaved sectors
摘要 Systems and methods relating generally to determining flaws on a storage medium.
申请公布号 US9640217(B1) 申请公布日期 2017.05.02
申请号 US201514954343 申请日期 2015.11.30
申请人 AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. 发明人 Singleton Jefferson
分类号 G11B5/09;G11B20/10;G11B5/02;G11B20/12 主分类号 G11B5/09
代理机构 Sheridan Ross P.C. 代理人 Sheridan Ross P.C.
主权项 1. A non-transitory storage medium maintaining information readable by an electronic data processing circuit, the non-transitory storage medium comprising: a first track including a first servo wedge, a second servo wedge, and a first user data region disposed between the first wedge and the second wedge, wherein the first user data region includes at least a first preamble pattern, a first group of data modified by a first pattern, and a second group of data modified by a second pattern; a second track adjacent to the first track, wherein the second track includes the first servo wedge, the second servo wedge, and a second user data region disposed between the first wedge and the second wedge, wherein the second user data region includes at least a second preamble pattern, a third group of data modified by the second pattern, and a fourth group of data modified by a third pattern such that the third group of data is not adjacent to the second group of data.
地址 Singapore SG