发明名称 Power module
摘要 A power module has a copper layer composed of copper or a copper alloy on a surface of a circuit layer to which a semiconductor device is bonded, and a solder layer that is formed by using a solder material is formed between the circuit layer and the semiconductor device. An average crystal grain size which is measured by EBSD measurement in a region having a thickness of up to 30 μm from the surface of the circuit layer in the solder layer is 10 μm or less, the solder layer has a composition that contains Sn as a main component, 0.01 to 1.0% by mass of Ni, and 0.1 to 5.0% by mass of Cu, and a thermal resistance increase rate when a power cycle is loaded 100,000 times is less than 10% in a power cycle test.
申请公布号 US9642275(B2) 申请公布日期 2017.05.02
申请号 US201314654199 申请日期 2013.12.20
申请人 MITSUBISHI MATERIALS CORPORATION 发明人 Ohashi Touyou;Nagatomo Yoshiyuki;Nagase Toshiyuki;Kuromitsu Yoshirou
分类号 H05K7/02;B23K35/26;C22C13/00;H01L23/00;H01L23/373;H01L23/488;B23K35/30;B23K35/02;B32B15/01;B23K101/40;B23K101/42;H01L23/473 主分类号 H05K7/02
代理机构 Locke Lord LLP 代理人 Locke Lord LLP
主权项 1. A power module comprising: a power module substrate that has a circuit layer arranged on one surface of an insulating layer; and a semiconductor device that is bonded to one surface of the circuit layer, wherein a copper layer composed of copper or a copper alloy is formed on the surface of the circuit layer to which the semiconductor device is bonded, a solder layer that is formed by using a solder material is formed between the circuit layer and the semiconductor device, an average crystal grain size which is measured by EBSD measurement in a region having a thickness of up to 30 μm from the surface of the circuit layer in the solder layer is within a range of 0.1 to 10 μm, the solder layer has a composition that contains Sn as a main component, 0.01 to 1.0% by mass of Ni, and 0.1 to 5.0% by mass of Cu, and a thermal resistance increase rate when a power cycle is loaded 100,000 times under conditions of a conduction duration of 5 seconds and a temperature difference of 80° C. is less than 10% in a power cycle test.
地址 Tokyo JP