发明名称 |
Electronic device, manufacturing method of electronic device, and sputtering target |
摘要 |
A film formation is performed using a target in which a material which is volatilized more easily than gallium when heated at 400° C. to 700° C., such as zinc, is added to gallium oxide by a sputtering method with high mass-productivity which can be applied to a large-area substrate, such as a DC sputtering method or a pulsed DC sputtering method. This film is heated at 400° C. to 700° C., whereby the added material is segregated in the vicinity of a surface of the film. Another portion of the film has a decreased concentration of the added material and a sufficiently high insulating property; therefore, it can be used for a gate insulator of a semiconductor device, or the like. |
申请公布号 |
US9640668(B2) |
申请公布日期 |
2017.05.02 |
申请号 |
US201414524224 |
申请日期 |
2014.10.27 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Yamazaki Shunpei |
分类号 |
H01L27/12;H01L29/786;C23C14/08;C23C14/34;H01L21/02;H01L29/49;H01L29/66;H01L29/04;H01L29/24 |
主分类号 |
H01L27/12 |
代理机构 |
Robinson Intellectual Property Law Office, P.C. |
代理人 |
Robinson Eric J.;Robinson Intellectual Property Law Office, P.C. |
主权项 |
1. An electronic device comprising:
a substrate; an oxide film over the substrate; and a semi-conductive oxide film over and in contact with the oxide film, wherein the oxide film comprises at least a first metal element and a second metal element, wherein a portion in contact with the semi-conductive oxide film has higher concentration of the first metal element in the oxide film than a portion facing the substrate, and wherein the portion in contact with the semi-conductive oxide film has lower concentration of the second metal element in the oxide film than the portion facing the substrate. |
地址 |
Atsugi-shi, Kanagawa-ken JP |