发明名称 |
Thin-film transistor (TFT), manufacturing method thereof, array substrate and display device |
摘要 |
A thin-film transistor (TFT), a manufacturing method thereof, an array substrate and a display device are disclosed. The method for manufacturing the a TFT comprises the step of forming a gate electrode, a gate insulating layer, an active area, a source electrode and a drain electrode on a base substrate. The active area (4) is made of a ZnON material. When the gate insulating layer is formed, a material for forming the gate insulating layer is subjected to control treatment, so that a sub-threshold amplitude of the TFT is less than or equal to 0.5 mV/dec. The manufacturing method reduces the sub-threshold amplitude of the TFT and improves the semiconductor characteristic of the TFT. |
申请公布号 |
US9640553(B2) |
申请公布日期 |
2017.05.02 |
申请号 |
US201414762076 |
申请日期 |
2014.11.21 |
申请人 |
BOE Technology Group Co., Ltd. |
发明人 |
Jiang Chunsheng |
分类号 |
H01L21/20;H01L21/36;H01L27/12;H01L29/786 |
主分类号 |
H01L21/20 |
代理机构 |
Banner & Witcoff, Ltd. |
代理人 |
Banner & Witcoff, Ltd. |
主权项 |
1. A method for manufacturing a thin-film transistor (TFT), comprising the step of forming a gate electrode, a gate insulating layer, an active area, a source electrode and a drain electrode on a base substrate, wherein
the active area is made from a ZnON material; and in the process that the gate insulating layer is formed, a material for forming the gate insulating layer is subjected to control treatment, so that a sub-threshold amplitude of the TFT is less than or equal to 0.5 mV/dec. |
地址 |
Beijing CN |