发明名称 Thin-film transistor (TFT), manufacturing method thereof, array substrate and display device
摘要 A thin-film transistor (TFT), a manufacturing method thereof, an array substrate and a display device are disclosed. The method for manufacturing the a TFT comprises the step of forming a gate electrode, a gate insulating layer, an active area, a source electrode and a drain electrode on a base substrate. The active area (4) is made of a ZnON material. When the gate insulating layer is formed, a material for forming the gate insulating layer is subjected to control treatment, so that a sub-threshold amplitude of the TFT is less than or equal to 0.5 mV/dec. The manufacturing method reduces the sub-threshold amplitude of the TFT and improves the semiconductor characteristic of the TFT.
申请公布号 US9640553(B2) 申请公布日期 2017.05.02
申请号 US201414762076 申请日期 2014.11.21
申请人 BOE Technology Group Co., Ltd. 发明人 Jiang Chunsheng
分类号 H01L21/20;H01L21/36;H01L27/12;H01L29/786 主分类号 H01L21/20
代理机构 Banner & Witcoff, Ltd. 代理人 Banner & Witcoff, Ltd.
主权项 1. A method for manufacturing a thin-film transistor (TFT), comprising the step of forming a gate electrode, a gate insulating layer, an active area, a source electrode and a drain electrode on a base substrate, wherein the active area is made from a ZnON material; and in the process that the gate insulating layer is formed, a material for forming the gate insulating layer is subjected to control treatment, so that a sub-threshold amplitude of the TFT is less than or equal to 0.5 mV/dec.
地址 Beijing CN