发明名称 Method of manufacturing a magnetoresistive memory device
摘要 According to one embodiment, a magnetoresistive memory device, includes a metal buffer layer provided on a substrate, a crystalline metal nitride buffer layer provided on the metal buffer layer, and a magnetoresistive element provided on the metal nitride buffer layer. The metal nitride buffer layer and the metal buffer layer contain a same material.
申请公布号 US9640584(B2) 申请公布日期 2017.05.02
申请号 US201514645239 申请日期 2015.03.11
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Nagamine Makoto;Eeh Youngmin;Ueda Koji;Watanabe Daisuke;Sawada Kazuya;Nagase Toshihiko
分类号 H01L21/00;H01L43/00;H01L27/22;H01L43/08;H01L43/12 主分类号 H01L21/00
代理机构 Holtz, Holtz & Volek PC 代理人 Holtz, Holtz & Volek PC
主权项 1. A method of manufacturing a magnetoresistive memory device, the method comprising: forming a metal buffer layer on a substrate; forming a metal nitride buffer layer on the metal buffer layer by nitriding the metal buffer layer; forming a magnetoresistive element comprising a magnetic layer on the metal nitride buffer layer; and etching the magnetoresistive element selectively up to the metal buffer layer.
地址 Tokyo JP