发明名称 |
Method of manufacturing a magnetoresistive memory device |
摘要 |
According to one embodiment, a magnetoresistive memory device, includes a metal buffer layer provided on a substrate, a crystalline metal nitride buffer layer provided on the metal buffer layer, and a magnetoresistive element provided on the metal nitride buffer layer. The metal nitride buffer layer and the metal buffer layer contain a same material. |
申请公布号 |
US9640584(B2) |
申请公布日期 |
2017.05.02 |
申请号 |
US201514645239 |
申请日期 |
2015.03.11 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
Nagamine Makoto;Eeh Youngmin;Ueda Koji;Watanabe Daisuke;Sawada Kazuya;Nagase Toshihiko |
分类号 |
H01L21/00;H01L43/00;H01L27/22;H01L43/08;H01L43/12 |
主分类号 |
H01L21/00 |
代理机构 |
Holtz, Holtz & Volek PC |
代理人 |
Holtz, Holtz & Volek PC |
主权项 |
1. A method of manufacturing a magnetoresistive memory device, the method comprising:
forming a metal buffer layer on a substrate; forming a metal nitride buffer layer on the metal buffer layer by nitriding the metal buffer layer; forming a magnetoresistive element comprising a magnetic layer on the metal nitride buffer layer; and etching the magnetoresistive element selectively up to the metal buffer layer. |
地址 |
Tokyo JP |