发明名称 Integrated circuit device, safety circuit, safety-critical system and method of manufacturing an integrated circuit device
摘要 An integrated circuit device comprises a first integrated circuit and a second integrated circuit wherein the first and second integrated circuits are comprised on a single semiconductor die. The second integrated circuit is a safety circuit arranged to monitor the operation of the first integrated circuit, report any detected faults and drive the device into a failsafe state if a fault is detected. The first integrated circuit may be a power management module for a safety critical system. An isolation barrier in the form of a trench is formed between the two integrated circuits so that the safety circuit is protected from any high voltage or thermal stresses arising in the first integrated circuit. The device has particular application to automotive safety-critical systems such as electric power steering systems.
申请公布号 US9638744(B2) 申请公布日期 2017.05.02
申请号 US201214409486 申请日期 2012.07.02
申请人 NXP USA, Inc. 发明人 Bernon-Enjalbert Valérie;Founaud Guillaume;Gao Yuan;Givelin Philippe
分类号 G01R31/28;H01L21/762;H01L21/22;H01L29/06;G01R31/3187;G01R31/3177;G06F17/50;H01L27/02 主分类号 G01R31/28
代理机构 代理人 Jacobsen Charlene R.
主权项 1. An integrated circuit device, comprising: a first integrated circuit provided in a first region of a semiconductor die; and a safety circuit arranged to monitor the operation of the first integrated circuit and to output an error signal when a fault in said operation is detected, the safety circuit being provided in a second region of the semiconductor die separated from the first region by an isolation barrier provided in the semiconductor die, the isolation barrier inhibiting a transfer of perturbations from the first integrated circuit to the safety-circuit, the safety circuit comprises: at least one fault monitoring module, the at least one fault monitoring module comprises a built in self test module, anda built in self test checker module operably coupled to the built in self test module, wherein the built in self test module generates status flags, and wherein the built in self test checker module is arranged to verify the validity of the status flags by monitoring their logical states.
地址 Austin TX US