发明名称 Pattern formation method
摘要 According to one embodiment, a pattern formation method includes forming a resist pattern on an underlying film, slimming the resist pattern, forming a pinning portion having affinity for a first polymer by depositing, on a surface of the slimmed resist pattern, an etching product produced by etching the underlying film, forming a neutral, film having affinity for the first polymer and a second polymer on the underlying film after the etching, forming a block copolymer film containing the first polymer and the second polymer on the pinning portion and the neutral film, forming a microphase separation pattern by applying a predetermined process to the block copolymer film to perform microphase separation.
申请公布号 US9640410(B2) 申请公布日期 2017.05.02
申请号 US201514808109 申请日期 2015.07.24
申请人 Kabushiki Kaisha Toshiba 发明人 Seino Yuriko
分类号 G03F7/004;H01L21/311;G03F7/16;G03F7/00;G03F7/40;H01L21/027;H01L21/033;B81C1/00;B82Y40/00 主分类号 G03F7/004
代理机构 Finnegan, Henderson, Farabow, Garrett & Dunner, LLP 代理人 Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
主权项 1. A pattern formation method comprising: forming a resist pattern on an underlying film; forming a pinning portion having affinity for a first polymer by slimming the resist pattern; forming a neutral film having affinity for the first polymer and a second polymer on a part of the underlying film which is not covered by the slimmed resist pattern; forming a block copolymer film containing the first polymer and the second polymer on the pinning portion and the neutral film; forming a microphase separation pattern by applying a predetermined process to the block copolymer film to perform microphase separation, the microphase separation pattern having a structure in which a first portion formed of the first polymer and a second portion formed of the second polymer are arranged; removing one of the first portion and the second portion; and etching the underlying film before slimming the resist pattern.
地址 Tokyo JP