发明名称 |
SEMICONDUCTOR DEVICE, ELECTRONIC CONTROL SYSTEM, AND AUTOMOBILE |
摘要 |
Abnormalities of multiple sensors with redundancy are detected with higher accuracy. A semiconductor device according to the present invention includes: a plurality of internal sensors that detect an identical object to be detected; a switching circuit that switches detection signals from the internal sensors at a predetermined frequency and outputs the signals; a correction information extracting circuit that extracts a first frequency component for correcting the output signal of a predetermined external sensor, from a converted signal based on an output of the switching circuit; and an abnormality information extracting circuit that extracts a second frequency component for detecting abnormalities of the internal sensors, from the converted signal based on the output of the switching circuit. |
申请公布号 |
US2017115318(A1) |
申请公布日期 |
2017.04.27 |
申请号 |
US201615137216 |
申请日期 |
2016.04.25 |
申请人 |
Renesas Electronics Corporation |
发明人 |
KASUYA Nobufumi |
分类号 |
G01P1/00;B60R21/01;G01P15/00 |
主分类号 |
G01P1/00 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a plurality of internal sensors that detect an identical object to be detected; a switching circuit that switches detection signals from the internal sensors at a predetermined frequency and outputs the signals; a correction information extracting circuit that extracts a first frequency component for correcting an output signal of a predetermined external sensor, from a converted signal based on an output of the switching circuit, and an abnormality information extracting circuit that extracts a second frequency component for detecting abnormalities of the internal sensors, from the converted signal based on the output of the switching circuit. |
地址 |
Tokyo JP |