发明名称 SEMICONDUCTOR DEVICE, ELECTRONIC CONTROL SYSTEM, AND AUTOMOBILE
摘要 Abnormalities of multiple sensors with redundancy are detected with higher accuracy. A semiconductor device according to the present invention includes: a plurality of internal sensors that detect an identical object to be detected; a switching circuit that switches detection signals from the internal sensors at a predetermined frequency and outputs the signals; a correction information extracting circuit that extracts a first frequency component for correcting the output signal of a predetermined external sensor, from a converted signal based on an output of the switching circuit; and an abnormality information extracting circuit that extracts a second frequency component for detecting abnormalities of the internal sensors, from the converted signal based on the output of the switching circuit.
申请公布号 US2017115318(A1) 申请公布日期 2017.04.27
申请号 US201615137216 申请日期 2016.04.25
申请人 Renesas Electronics Corporation 发明人 KASUYA Nobufumi
分类号 G01P1/00;B60R21/01;G01P15/00 主分类号 G01P1/00
代理机构 代理人
主权项 1. A semiconductor device comprising: a plurality of internal sensors that detect an identical object to be detected; a switching circuit that switches detection signals from the internal sensors at a predetermined frequency and outputs the signals; a correction information extracting circuit that extracts a first frequency component for correcting an output signal of a predetermined external sensor, from a converted signal based on an output of the switching circuit, and an abnormality information extracting circuit that extracts a second frequency component for detecting abnormalities of the internal sensors, from the converted signal based on the output of the switching circuit.
地址 Tokyo JP