发明名称 RF/mm-Wave Peak Detector with High-Dynamic Range Calibration
摘要 An integrated circuit (IC) is provided with a plurality of diode based mm-wave peak voltage detectors (PVD)s. During a testing phase, a multi-point low frequency calibration test is performed one more of the PVDs to determine and store a set of alternating current (AC) coefficients. During operation of the IC, a current-voltage sweep is performed on a selected one of the PVDs to determine a process and temperature direct current (DC) coefficient. A peak voltage produced by the PVD in response to a high frequency radio frequency (RF) signal is measured to produce a first measured voltage. An approximate power of the RF signal is calculated by adjusting the first measured voltage using the DC coefficient and the AC coefficient.
申请公布号 US2017115377(A1) 申请公布日期 2017.04.27
申请号 US201514921475 申请日期 2015.10.23
申请人 Texas Instruments Incorporated 发明人 Giannini Vito;Ginsburg Brian Paul
分类号 G01S7/40 主分类号 G01S7/40
代理机构 代理人
主权项 1. A method for operating a diode based mm-wave peak voltage detector in an integrated circuit, the method comprising: performing a current-voltage sweep on the peak voltage detector to determine a process and temperature direct current (DC) coefficient; measuring a peak voltage produced by the PVD in response to a high frequency radio frequency (RF) signal to produce a first measured voltage; accessing stored calibration data produced by performing an alternating current (AC) calibration with one or more test points on the peak voltage detector to determine an AC coefficient; and calculating an approximate power of the RF signal by adjusting the first measured voltage using the DC coefficient and the AC coefficient.
地址 Dallas TX US