发明名称 ANTI-COUNTERFEITING FEATURES AND METHODS OF FABRICATION AND DETECTION
摘要 Aspects of the present disclosure include an anti-counterfeiting pattern that is identifiable by sheet resistance mapping metrology, a method of fabricating such an anti-counterfeiting device, and a method of detecting such an anti-counterfeiting device by imaging the pattern with sheet resistance mapping metrology. This abstract is provided to comply with rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.
申请公布号 US2017116808(A1) 申请公布日期 2017.04.27
申请号 US201615360884 申请日期 2016.11.23
申请人 METAMATERIAL TECHNOLOGIES USA, INC. 发明人 Kobrin Boris
分类号 G07D7/02;B42D25/351;G07D7/00;B42D25/378;G07D7/12;B42D25/373;B42D25/42 主分类号 G07D7/02
代理机构 代理人
主权项 1. An anti-counterfeiting device, comprises: a structure having an anti-counterfeiting pattern, wherein the anti-counterfeiting pattern is identifiable as an anti-counterfeiting feature by sheet resistance mapping metrology.
地址 Pleasanton CA US