| 发明名称 |
SCAN SYSTEM INTERFACE (SSI) MODULE |
| 摘要 |
A method for testing. The method includes sending a single instruction over a JTAG interface to a JTAG controller to select a first internal test data register of a plurality of data registers. The method includes programming the first internal test data register using the JTAG interface to configure mode control access and state control access for a test controller implementing a sequential scan architecture to test a chip at a system level. |
| 申请公布号 |
US2017115346(A1) |
申请公布日期 |
2017.04.27 |
| 申请号 |
US201615336747 |
申请日期 |
2016.10.27 |
| 申请人 |
NVIDIA CORPORATION |
发明人 |
Sonawane Milind;Sanghani Amit;Colburn Jonathon E.;Kumar reddy.S Rajendra;Nelapatla Bala Tarun;Chadalavda Sailendra;Sarangi Shantanu |
| 分类号 |
G01R31/3177;G01R31/317 |
主分类号 |
G01R31/3177 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A computer system comprising:
a processor; and memory coupled to said processor and having stored therein instructions that, if executed by said computer system, cause said computer system to execute a method for testing comprising: sending an instruction to a JTAG controller to select a first internal test data register of a plurality of data registers; programming said first internal test data register to configure mode control access and state control access for a test controller implementing a sequential scan architecture at a system level. |
| 地址 |
Santa Clara CA US |
