发明名称 VIBRATING DEVICE FOR POSITIONING A MINIATURIZED PIECE IN A TESTING ACCOMMODATION, AND POSITIONING METHOD
摘要 A for positioning a miniaturized piece includes a positioning structure that forms a first cavity designed to receive with play the miniaturized piece and a second cavity communicating with the first cavity. At least one electrical-contact terminal is provided facing the second cavity and is electrically coupleable to an electronic testing device designed to carry out an electrical test on the miniaturized piece. An actuator device causes a vibration of the positioning structure such that the vibration translates the miniaturized piece towards the second cavity until it penetrates at least in part into the second cavity.
申请公布号 US2017115341(A1) 申请公布日期 2017.04.27
申请号 US201715401435 申请日期 2017.01.09
申请人 STMicroelectronics S.r.l. 发明人 Frigoli Fabiano;Ballotta Giuseppe;Greppi Massimo;Falorni Luca Giuseppe;Aranzulla Paolo
分类号 G01R31/28;G01R1/04 主分类号 G01R31/28
代理机构 代理人
主权项 1. A device for positioning and testing a plurality of integrated circuit chips, the device comprising: an plurality of holders, each of the plurality of holders comprising: a first receptacle configured to receive one of the plurality of integrated circuit chips in a first direction from an external source, each of the plurality of integrated circuit chips having a conductive signal pad; anda second receptacle configured to receive the one of the plurality of integrated circuit chips in a second direction that is substantially orthogonal to the first direction, wherein the second receptacle has a conductive signal terminal; and a positioner configured to move the one of the plurality of integrated circuit chips from the first receptacle, along the second direction, into the second receptacle to a position where the conductive signal pad is in electrical contact with the conductive signal terminal.
地址 Agrate Brianza IT