发明名称 Apparatus for error simulation and method thereof
摘要 The present invention relates to an apparatus for computing an error rate comprising: a first circuit interface being connected to a first sub-circuit receiving data and computing output data through a predetermined computation process; a second circuit interface and being connected to a first test circuit receiving the same data, which is inputted to the first sub-circuit, and computing output data through the predetermined computation process; an error injecting part injecting an error to the first test circuit; an error detecting part comparing output data of the first sub-circuit to output data of the first test circuit; and an error rate computing part computing input node error probability of the first sub-circuit by statistic processing of the compared result. The apparatus and method for computing error rate of the present invention is able to shorten the time required to obtain error probability, compared to the direct simulation of the full circuit.
申请公布号 US9632894(B2) 申请公布日期 2017.04.25
申请号 US201514677297 申请日期 2015.04.02
申请人 Electronics and Telecommunications Research Institute 发明人 Han Jin-Ho;Kwon Young-Su;Byun Kyung-Jin
分类号 G06F11/00;G06F11/22 主分类号 G06F11/00
代理机构 William Park & Associates Ltd. 代理人 William Park & Associates Ltd.
主权项 1. An apparatus for computing an error rate comprising: a first circuit interface being connected to a first sub-circuit receiving data and computing output data through a predetermined computation process; a second circuit interface being connected to a first test circuit receiving the same data, which is inputted to the first sub-circuit, and computing output data through the predetermined computation process; an error injecting part injecting an error to the first test circuit through the first circuit interface; an error detecting part comparing output data of the first sub-circuit to output data of the first test circuit and producing a compared result; and an error rate computing part computing an input node error probability of the first sub-circuit by statistic processing of the compared result.
地址 Daejeon KR