发明名称 Method for metal gate surface clean
摘要 The present disclosure provides a method for forming an integrated circuit (IC) structure. The method includes providing a metal gate (MG), an etch stop layer (ESL) formed on the MG, and a dielectric layer formed on the ESL. The method further includes etching the ESL and the dielectric layer to form a trench. A surface of the MG exposed in the trench is oxidized to form a first oxide layer on the MG. The method further includes removing the first oxide layer using a H3PO4 solution.
申请公布号 US9633832(B2) 申请公布日期 2017.04.25
申请号 US201615049420 申请日期 2016.02.22
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD 发明人 Suen Shich-Chang;Wu Li-Chieh;Liu Chi-Jen;Peng He Hui;Chen Liang-Guang;Chen Yung-Chung
分类号 H01L21/3205;H01L21/4763;H01L21/02;H01L21/28;H01L21/311;H01L21/768;H01L29/40;H01L29/66 主分类号 H01L21/3205
代理机构 Haynes and Boone, LLP 代理人 Haynes and Boone, LLP
主权项 1. A method comprising: providing a metal gate with a material layer disposed thereover; removing a portion of the material layer to form a trench, a surface of the metal exposed in the trench being oxidized to form a first oxide layer on the metal gate; removing the first oxide layer; forming a second oxide layer on the metal gate; and reducing the second oxide layer to a metal included in the metal gate using a reducing agent.
地址 Hsin-Chu TW