发明名称 |
Method for metal gate surface clean |
摘要 |
The present disclosure provides a method for forming an integrated circuit (IC) structure. The method includes providing a metal gate (MG), an etch stop layer (ESL) formed on the MG, and a dielectric layer formed on the ESL. The method further includes etching the ESL and the dielectric layer to form a trench. A surface of the MG exposed in the trench is oxidized to form a first oxide layer on the MG. The method further includes removing the first oxide layer using a H3PO4 solution. |
申请公布号 |
US9633832(B2) |
申请公布日期 |
2017.04.25 |
申请号 |
US201615049420 |
申请日期 |
2016.02.22 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD |
发明人 |
Suen Shich-Chang;Wu Li-Chieh;Liu Chi-Jen;Peng He Hui;Chen Liang-Guang;Chen Yung-Chung |
分类号 |
H01L21/3205;H01L21/4763;H01L21/02;H01L21/28;H01L21/311;H01L21/768;H01L29/40;H01L29/66 |
主分类号 |
H01L21/3205 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method comprising:
providing a metal gate with a material layer disposed thereover; removing a portion of the material layer to form a trench, a surface of the metal exposed in the trench being oxidized to form a first oxide layer on the metal gate; removing the first oxide layer; forming a second oxide layer on the metal gate; and reducing the second oxide layer to a metal included in the metal gate using a reducing agent. |
地址 |
Hsin-Chu TW |