发明名称 DEEP TRENCH ISOLATION STRUCTURES AND SYSTEMS AND METHODS INCLUDING THE SAME
摘要 Deep trench isolation structures and systems and methods including the same are disclosed herein. The systems include a semiconductor device. The semiconductor device includes a semiconductor body, a device region, and the deep trench isolation structure. The deep trench isolation structure is configured to electrically isolate the device region from other device regions that extend within the semiconductor body. The deep trench isolation structure includes an isolation trench, a dielectric material that extends within the isolation trench, a first semiconducting region, and a second semiconducting region. The methods include methods of operating an integrated circuit device that includes a plurality of semiconductor devices that include the disclosed deep trench isolation structures.
申请公布号 US2017110537(A1) 申请公布日期 2017.04.20
申请号 US201615395292 申请日期 2016.12.30
申请人 NXP USA, Inc. 发明人 Cheng Xu;Blomberg Daniel J.;Zuo Jiang-Kai
分类号 H01L29/06;H01L21/8234;H01L27/02;H01L21/762 主分类号 H01L29/06
代理机构 代理人
主权项
地址 Austin TX US