发明名称 METAL STRAP FOR DRAM/FINFET COMBINATION
摘要 A metal strap is formed in a middle-of-line (MOL) process for communication between an eDRAM and a FinFET. An oxide is deposited in a trench over the eDRAM to prevent development of an epitaxial film prior to formation of the metal strap. The result is an epiless eDRAM strap in a FinFET.
申请公布号 US2017110460(A1) 申请公布日期 2017.04.20
申请号 US201615394068 申请日期 2016.12.29
申请人 International Business Machines Corporation 发明人 Leobandung Effendi
分类号 H01L27/108;H01L29/94;H01L27/12 主分类号 H01L27/108
代理机构 代理人
主权项 1. A structure for a semiconductor device, the structure comprising: a storage capacitor formed in a deep trench of a semiconductor substrate; a transistor formed on the semiconductor substrate; a fin of a transistor, formed with an adjacent oxide deposit; an epitaxial film grown on the fin of the transistor; a metal strap deposited in an opening, the metal strap connecting the transistor to the storage capacitor; wherein: the adjacent oxide deposit is located above, and in contact with, a conductive region of the storage capacitor.
地址 Armonk NY US