发明名称 |
METAL STRAP FOR DRAM/FINFET COMBINATION |
摘要 |
A metal strap is formed in a middle-of-line (MOL) process for communication between an eDRAM and a FinFET. An oxide is deposited in a trench over the eDRAM to prevent development of an epitaxial film prior to formation of the metal strap. The result is an epiless eDRAM strap in a FinFET. |
申请公布号 |
US2017110460(A1) |
申请公布日期 |
2017.04.20 |
申请号 |
US201615394068 |
申请日期 |
2016.12.29 |
申请人 |
International Business Machines Corporation |
发明人 |
Leobandung Effendi |
分类号 |
H01L27/108;H01L29/94;H01L27/12 |
主分类号 |
H01L27/108 |
代理机构 |
|
代理人 |
|
主权项 |
1. A structure for a semiconductor device, the structure comprising:
a storage capacitor formed in a deep trench of a semiconductor substrate; a transistor formed on the semiconductor substrate; a fin of a transistor, formed with an adjacent oxide deposit; an epitaxial film grown on the fin of the transistor; a metal strap deposited in an opening, the metal strap connecting the transistor to the storage capacitor; wherein: the adjacent oxide deposit is located above, and in contact with, a conductive region of the storage capacitor. |
地址 |
Armonk NY US |