发明名称 Semiconductor device
摘要 A semiconductor device includes a first semiconductor layer, a second semiconductor layer over the first semiconductor layer, source and drain electrodes over the second semiconductor layer, a gate electrode, and a first field plate electrode. The second semiconductor layer includes a first semiconductor portion and a second semiconductor portion thinner than the first semiconductor portion. The source and drain electrodes are electrically connected to the second semiconductor layer. The gate electrode is provided over the second semiconductor layer between the source electrode and the drain electrode. The first field plate electrode is provided over the second semiconductor layer and includes a portion that extends from a location over the gate electrode toward the drain electrode and has an end portion that is positioned over the second semiconductor portion.
申请公布号 US9627504(B2) 申请公布日期 2017.04.18
申请号 US201514635338 申请日期 2015.03.02
申请人 Kabushiki Kaisha Toshiba 发明人 Oasa Kohei;Yoshioka Akira;Isobe Yasuhiro
分类号 H01L29/778;H01L29/20;H01L29/66;H01L21/306;H01L21/308;H01L29/423;H01L29/06;H01L29/10;H01L29/40 主分类号 H01L29/778
代理机构 Patterson & Sheridan, LLP 代理人 Patterson & Sheridan, LLP
主权项 1. A method of manufacturing a compound semiconductor device, comprising: providing a first compound semiconductor layer; providing a second compound semiconductor layer on the first compound semiconductor layer, wherein the thickness of the second compound semiconductor layer includes a relatively thick portion and at least one thinner portion; depositing, as the second compound semiconductor layer, a first sub-layer of a compound semiconductor material on the first compound semiconductor layer; depositing an etch stop layer on the first sub-layer of a compound semiconductor material; depositing a second sub-layer of a compound semiconductor material on the etch stop layer; and etching an opening through the second sub-layer of a compound semiconductor layer and stopping the etching on the etch stop layer.
地址 Tokyo JP