发明名称 System and method for the validation and quality assurance of computerized contours of human anatomy
摘要 A system and method for validating the accuracy of delineated contours in computerized imaging using statistical data for generating assessment criterion that define acceptable tolerances for delineated contours, with the statistical data being conditionally updated and/or refined between individual processes for validating delineated contours to thereby adjust the tolerances defined by the assessment criterion in the stored statistical data, such that the stored statistical data is more closely representative of a target population. The present invention may be used to facilitate, as one example, on-line adaptive radiation therapy.
申请公布号 US9626757(B2) 申请公布日期 2017.04.18
申请号 US201414454000 申请日期 2014.08.07
申请人 Washington University 发明人 Altman Michael B.;Green Olga;Kavanaugh James;Li Hua;Mutic Sasa;Wooten Hasani
分类号 G06K9/00;G06T7/00 主分类号 G06K9/00
代理机构 Smith, Gambrell & Russell, LLP 代理人 Smith, Gambrell & Russell, LLP
主权项 1. A system for validating the accuracy of delineated contours in computerized imaging, with result feedback, comprising: a storage unit storing one or more assessment metrics, each assessment metric being associated with a selected delineated contour; and a feedback processor configured to conditionally update and/or refine the stored one or more assessment metrics, by: receiving a data set associated with one or more computer representations of a delineated anatomy of a patient,selecting at least one of the one or more assessment metrics stored in the storage unit, wherein the selected at least one assessment metric is associated with the one or more computer representations of the delineated anatomy of the patient, andapplying the selected at least one assessment metric to the one or more computer representations, to generate one or more resultant metrics, wherein the storage unit further stores metric standards and metric modifiers associated with the selected delineated contour, and wherein the feedback processor is further configured to: generate an acceptable tolerance for the one or more resultant metrics, based on the stored metric standards and metric modifiers,compare the one or more resultant metrics to the generated acceptable tolerance, andadjust one or both of stored metric standards and metric modifiers, such that a subsequent performance by the feedback processor may use the adjusted stored metric standards and/or metric modifiers.
地址 St. Louis MO US