发明名称 |
Semiconductor memory device and method for manufacturing the same |
摘要 |
A semiconductor memory device according to an embodiment, includes a stacked body, a semiconductor member, a charge storage layer, a charge block layer and an electrode antioxidant layer. The stacked body includes a plurality of electrode layers stacked separated from each other and an inter-electrode insulating layer between the electrode layers. The semiconductor member extends in a stacking direction of the stacked body and penetrates the stacked body. The tunnel insulating layer is provided on a side surface of the semiconductor member. The charge storage layer is provided on a side surface of the tunnel insulating layer. The charge block layer is provided on a side surface of the charge storage layer and contains oxygen. The electrode antioxidant layer is provided between the charge block layer and the electrode layer and has a composition different from that of the electrode layer. |
申请公布号 |
US9627402(B2) |
申请公布日期 |
2017.04.18 |
申请号 |
US201514749830 |
申请日期 |
2015.06.25 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
Furuhashi Takashi;Tanaka Masayuki;Toratani Kenichiro |
分类号 |
H01L29/792;H01L27/11582;H01L29/423;H01L27/1157 |
主分类号 |
H01L29/792 |
代理机构 |
Finnegan, Henderson, Farabrow, Garrett & Dunner LLP |
代理人 |
Finnegan, Henderson, Farabrow, Garrett & Dunner LLP |
主权项 |
1. A semiconductor memory device comprising:
a stacked body including a plurality of electrode layers stacked separated from each other and an inter-electrode insulating layer between the electrode layers; a semiconductor member extending in a stacking direction of the stacked body and penetrating the stacked body; a tunnel insulating layer provided on a side surface of the semiconductor member; a charge storage layer provided on a side surface of the tunnel insulating layer; a charge block layer provided on a side surface of the charge storage layer and containing oxygen; and an electrode antioxidant layer provided between the charge block layer and the electrode layer and having a composition different from that of the electrode layer, wherein as viewed from a direction vertical to the stacking direction, the charge storage layer and the charge block layer that are stacked in a direction of the semiconductor member on a side surface side of the electrode antioxidant layer project in a direction of the tunnel insulating layer beyond the charge storage layer and the charge block layer that are stacked in the direction of the semiconductor member on a side surface side of the inter-electrode insulating layer. |
地址 |
Tokyo JP |