发明名称 Methods and systems for dopant activation using microwave radiation
摘要 A semiconductor structure includes a substrate, a source/drain (S/D) junction, and an S/D contact. The S/D junction is associated with the substrate and includes a trench-defining wall, a semiconductor layer, and a semiconductor material. The trench-defining wall defines a trench. The semiconductor layer is formed over the trench-defining wall, partially fills the trench, substantially covers the trench-defining wall, and includes germanium. The semiconductor material is formed over the semiconductor layer and includes germanium, a percentage composition of which is greater than a percentage composition of the germanium of the semiconductor layer. The S/D contact is formed over the S/D junction.
申请公布号 US9627212(B2) 申请公布日期 2017.04.18
申请号 US201615217024 申请日期 2016.07.22
申请人 Taiwan Semiconductor Manufacturing Company Limited 发明人 Tsai Chun-Hsiung;Yang Huai-Tei;Yu Kuo-Feng;Chen Kei-Wei
分类号 H01L21/26;H01L21/268;H01L21/02;H01L21/67;H05B6/80;H01L21/324;H01L21/225;H01L29/08;H01L29/167;H01L29/32;H01L29/66;H01L29/78 主分类号 H01L21/26
代理机构 Jones Day 代理人 Jones Day
主权项 1. A semiconductor structure comprising: a substrate; a source/drain (S/D) junction associated with the substrate and including a trench-defining wall that defines a trench,a semiconductor layer that is formed over the trench-defining wall, that partially fills the trench, that substantially covers the trench-defining wall, and that includes germanium, anda semiconductor material that is formed over the semiconductor layer and that includes germanium, a percentage composition of which is greater than a percentage composition of the germanium of the semiconductor layer; and an S/D contact formed over the S/D junction.
地址 Hsinchu TW