发明名称 Methods of forming patterns using photoresist polymers
摘要 A photoresist polymer comprising a first repeating unit including a halogen donor group and a second repeating unit including a protecting group connected by a sulfide bond.
申请公布号 US9625816(B2) 申请公布日期 2017.04.18
申请号 US201514886155 申请日期 2015.10.19
申请人 Samsung Electronics Co., Ltd. 发明人 Park Jin;Kim Hyun-Woo;Han Jin-Kyu
分类号 G03F7/039;G03F7/36;G03F7/32;G03F7/20;G03F7/16;G03F7/26;G03F7/004;G03F7/30 主分类号 G03F7/039
代理机构 Myers Bigel, P.A. 代理人 Myers Bigel, P.A.
主权项 1. A method of forming a pattern, comprising: forming a photoresist layer on an object layer, the photoresist layer including a polymer that comprises a first repeating unit including a halogen donor group, and a second repeating unit including a leaving group capable of being removed from the polymer by a photochemical reaction, the leaving group being connected to the second repeating unit by a sulfide bond; performing an exposure process on the photoresist layer such that the photoresist layer is divided into an exposed portion and a non-exposed portion, wherein the exposure process is performed by at least one light source; and removing the exposed portion of the photoresist layer to form a photoresist pattern.
地址 Suwon-si KR