发明名称 |
Methods of forming patterns using photoresist polymers |
摘要 |
A photoresist polymer comprising a first repeating unit including a halogen donor group and a second repeating unit including a protecting group connected by a sulfide bond. |
申请公布号 |
US9625816(B2) |
申请公布日期 |
2017.04.18 |
申请号 |
US201514886155 |
申请日期 |
2015.10.19 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Park Jin;Kim Hyun-Woo;Han Jin-Kyu |
分类号 |
G03F7/039;G03F7/36;G03F7/32;G03F7/20;G03F7/16;G03F7/26;G03F7/004;G03F7/30 |
主分类号 |
G03F7/039 |
代理机构 |
Myers Bigel, P.A. |
代理人 |
Myers Bigel, P.A. |
主权项 |
1. A method of forming a pattern, comprising:
forming a photoresist layer on an object layer, the photoresist layer including a polymer that comprises a first repeating unit including a halogen donor group, and a second repeating unit including a leaving group capable of being removed from the polymer by a photochemical reaction, the leaving group being connected to the second repeating unit by a sulfide bond; performing an exposure process on the photoresist layer such that the photoresist layer is divided into an exposed portion and a non-exposed portion, wherein the exposure process is performed by at least one light source; and removing the exposed portion of the photoresist layer to form a photoresist pattern. |
地址 |
Suwon-si KR |