发明名称 Method and apparatus for measuring gloss
摘要 An apparatus of measuring a small scale property of a sheet, the apparatus includes: a first light source for illuminating the sheet moving with respect to the illumination; a detector for forming a total intensity of reflection of the light illuminating the moving sheet by each detection; a detected dimension of the reflection on the sheet in the direction of the movement being limited the same as or shorter than a lowest acceptable spatial resolution of the measurement; a duration of each detection being equal to or shorter than the lowest acceptable spatial resolution divided by a speed of the moving sheet; and a processing unit for forming information about a small scale variation of gloss of the sheet on the basis of the detections by the detector.
申请公布号 US9625382(B2) 申请公布日期 2017.04.18
申请号 US201314439259 申请日期 2013.10.30
申请人 VALMET AUTOMATION OY 发明人 Mäntylä Markku
分类号 G01N21/55;G01N21/57;G01N21/47;G01N21/86;G01N21/89;G01N33/34 主分类号 G01N21/55
代理机构 Oliff PLC 代理人 Oliff PLC
主权项 1. An apparatus of measuring a small scale property of a sheet, the apparatus comprising: a first light source comprises at least one of the following: led and laser, and the first light source is configured to illuminate the sheet moving with respect to the illumination; a detector configured to form a total intensity of reflection of the light illuminating a detected spot on the moving sheet by each detection; a detected dimension of the reflection of the spot on the sheet in the direction of the movement being limited the same as or shorter than a lowest acceptable spatial resolution of the measurement; a duration of each detection being equal to or shorter than the lowest acceptable spatial resolution divided by a speed of the moving sheet; and at least one processor configured to form information about a small scale variation of gloss of the sheet on the basis of the detections by the detector.
地址 Espoo FI