发明名称 |
Method and apparatus for measuring gloss |
摘要 |
An apparatus of measuring a small scale property of a sheet, the apparatus includes: a first light source for illuminating the sheet moving with respect to the illumination; a detector for forming a total intensity of reflection of the light illuminating the moving sheet by each detection; a detected dimension of the reflection on the sheet in the direction of the movement being limited the same as or shorter than a lowest acceptable spatial resolution of the measurement; a duration of each detection being equal to or shorter than the lowest acceptable spatial resolution divided by a speed of the moving sheet; and a processing unit for forming information about a small scale variation of gloss of the sheet on the basis of the detections by the detector. |
申请公布号 |
US9625382(B2) |
申请公布日期 |
2017.04.18 |
申请号 |
US201314439259 |
申请日期 |
2013.10.30 |
申请人 |
VALMET AUTOMATION OY |
发明人 |
Mäntylä Markku |
分类号 |
G01N21/55;G01N21/57;G01N21/47;G01N21/86;G01N21/89;G01N33/34 |
主分类号 |
G01N21/55 |
代理机构 |
Oliff PLC |
代理人 |
Oliff PLC |
主权项 |
1. An apparatus of measuring a small scale property of a sheet, the apparatus comprising:
a first light source comprises at least one of the following: led and laser, and the first light source is configured to illuminate the sheet moving with respect to the illumination; a detector configured to form a total intensity of reflection of the light illuminating a detected spot on the moving sheet by each detection; a detected dimension of the reflection of the spot on the sheet in the direction of the movement being limited the same as or shorter than a lowest acceptable spatial resolution of the measurement; a duration of each detection being equal to or shorter than the lowest acceptable spatial resolution divided by a speed of the moving sheet; and at least one processor configured to form information about a small scale variation of gloss of the sheet on the basis of the detections by the detector. |
地址 |
Espoo FI |