发明名称 Temperature Control in RF Chamber with Heater and Air Amplifier
摘要 Systems, methods, and computer programs are presented for controlling the temperature of a window in a semiconductor manufacturing chamber. One apparatus includes a heater for receiving and heating a flow of air and an air amplifier coupled to pressurized gas. The air amplifier has an input that receives the flow of air from the heater, and the air amplifier having an output. A duct is coupled to the output of the air amplifier and a plenum is coupled to the duct. The plenum receives the flow of air and distributes the flow of air over a window of a plasma chamber. A temperature sensor is situated about the window of the plasma chamber and a controller is provided to control the air amplifier and the heater based on a temperature measured by the temperature sensor.
申请公布号 US2017103875(A1) 申请公布日期 2017.04.13
申请号 US201615384209 申请日期 2016.12.19
申请人 Lam Research Corporation 发明人 McChesney Jon;Paterson Alex
分类号 H01J37/32 主分类号 H01J37/32
代理机构 代理人
主权项 1. An apparatus, comprising: a heater for receiving and heating a flow of air; an air amplifier coupled to pressurized gas, the air amplifier having an input that receives the flow of air from the heater, the air amplifier having an output; a duct coupled to the output of the air amplifier; a plenum coupled to the duct, wherein the plenum receives the flow of air and distributes the flow of air over a window of a plasma chamber; a temperature sensor situated about the window of the plasma chamber; and a controller defined to control the air amplifier and the heater based on a temperature measured by the temperature sensor.
地址 Fremont CA US