发明名称 FORCE DETECTION APPARATUS
摘要 A force detection apparatus includes a substrate and a force transmission block. The substrate includes: a high-sensitive mesa gauge that is provided on a main surface, extends in a first direction to produce a relatively large change of an electric resistance in accordance with compressive stress, and includes a top surface; a low-sensitive mesa gauge that is provided on the main surface, extends in a second direction to produce a relatively small change of an electric resistance, and includes a top surface; and a mesa lead that is provided on the main surface, extends in a third direction, and includes a top surface. The force transmission block contacts the top surface of the high-sensitive mesa gauge and the top surface of the low-sensitive mesa gauge, and is non-contact with at least a part of the top surface of the mesa lead.
申请公布号 US2017102274(A1) 申请公布日期 2017.04.13
申请号 US201515128453 申请日期 2015.03.24
申请人 DENSO CORPORATION 发明人 MIZUNO Kentaro;TAGUCHI Rie;HASHIMOTO Shoji;OHIRA Yoshie;KATSUMATA Takashi;YAMAGUCHI Kouhei
分类号 G01L1/18;G01L9/06;G01L9/00 主分类号 G01L1/18
代理机构 代理人
主权项 1. A force detection apparatus comprising: a substrate including a main surface; and a force transmission block, wherein: the substrate includes a high-sensitive mesa gauge that is provided on the main surface, extends in a first direction to produce a relatively large change of an electric resistance in accordance with compressive stress, and includes a top surface,a low-sensitive mesa gauge that is provided on the main surface, extends in a second direction to produce a relatively small change of an electric resistance in accordance with compressive stress, and includes a top surface, anda mesa lead that is provided on the main surface, extends in a third direction from a connection portion connecting the high-sensitive mesa gauge and the low-sensitive mesa gauge, and includes a top surface; and the force transmission block contacts the top surface of the high-sensitive mesa gauge and the top surface of the low-sensitive mesa gauge, and is non-contact with at least a part of the top surface of the mesa lead.
地址 Kariya-city, Aichi-pref. JP