发明名称 METHOD FOR MANUFACTURE OF A SEMICONDUCTOR WAFER SUITABLE FOR THE MANUFACTURE OF AN SOI SUBSTRATE, AND SOI SUBSTRATE WAFER THUS OBTAINED
摘要 A semiconductor wafer suitable for fabricating an SOI substrate is provided by: producing a first layer of polycrystalline semiconductor on a top side of a semiconductor carrier; then forming an interface zone on a top side of the first layer, wherein the interface zone has a structure different from a crystal structure of the first layer; and then producing a second layer of polycrystalline semiconductor on the interface zone.
申请公布号 US2017103913(A1) 申请公布日期 2017.04.13
申请号 US201515129328 申请日期 2015.03.27
申请人 STMicroelectronics SA 发明人 Dutartre Didier;Jaouen Herve
分类号 H01L21/762;H01L21/02 主分类号 H01L21/762
代理机构 代理人
主权项 1. Process for producing a silicon-on-insulator substrate, including: producing a carrier substrate, and producing a semiconductor film located on top of a buried insulating layer itself located on top of the carrier substrate, wherein producing the carrier substrate comprises producing, on one side of a semiconductor carrier, a stack located between said semiconductor carrier and said buried insulating layer and including at least one initial structure, wherein producing said at least one initial structure comprises the following successive steps: producing, on said one side of said semiconductor carrier, a first layer of polycrystalline semiconductor; forming an interface zone on a top side of said first layer, said interface zone having a structure different from a crystal structure of said first layer; and producing, on said interface zone, a second layer of polycrystalline semiconductor.
地址 Montrouge FR