发明名称 |
Device Including Transparent Layer with Profiled Surface for Improved Extraction |
摘要 |
A profiled surface for improving the propagation of radiation through an interface is provided. The profiled surface includes a set of large roughness components providing a first variation of the profiled surface having a characteristic scale approximately an order of magnitude larger than a target wavelength of the radiation. The set of large roughness components can include a series of truncated shapes. The profiled surface also includes a set of small roughness components superimposed on the set of large roughness components and providing a second variation of the profiled surface having a characteristic scale on the order of the target wavelength of the radiation. |
申请公布号 |
US2017104131(A1) |
申请公布日期 |
2017.04.13 |
申请号 |
US201615390575 |
申请日期 |
2016.12.26 |
申请人 |
Sensor Electronic Technology, Inc. |
发明人 |
Shatalov Maxim S.;Dobrinsky Alexander;Shur Michael;Gaska Remigijus |
分类号 |
H01L33/22;H01L33/14;H01L33/62;H01L33/00;H01L33/32;H01L33/24 |
主分类号 |
H01L33/22 |
代理机构 |
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代理人 |
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主权项 |
1. A device comprising:
a group III nitride heterostructure; and an at least partially transparent substrate having a first side and a second side, wherein the group III nitride heterostructure is located on the second side, and wherein radiation passes through the second side, and wherein the second side comprises a profiled surface, the profiled surface including:
a plurality of large roughness components providing a first variation of the profiled surface having a characteristic scale approximately an order of magnitude larger than a target wavelength of the radiation, wherein the plurality of large roughness components comprise a series of truncated shapes formed of a material of the at least partially transparent substrate, wherein at least one of the series of truncated shapes is inversely truncated with respect to a direction the radiation travels through the at least partially transparent substrate; anda plurality of small roughness components providing a second variation of the profiled surface having a characteristic scale on the order of the target wavelength of the radiation, wherein the plurality of small roughness components are superimposed on the plurality of large roughness components, wherein a graded refractive index along a height of each small roughness component in the plurality of small roughness components decreases substantially linearly along the height. |
地址 |
Columbia SC US |