发明名称 Memory Arrays
摘要 The invention includes semiconductor constructions having trenched isolation regions. The trenches of the trenched isolation regions can include narrow bottom portions and upper wide portions over the bottom portions. Electrically insulative material can fill the upper wide portions while leaving voids within the narrow bottom portions. The trenched isolation regions can be incorporated into a memory array, and/or can be incorporated into an electronic system. The invention also includes methods of forming semiconductor constructions.
申请公布号 US2017104059(A1) 申请公布日期 2017.04.13
申请号 US201615385783 申请日期 2016.12.20
申请人 Micron Technology, Inc. 发明人 Bian Zailong;Fucsko Janos
分类号 H01L29/06;H01L27/115 主分类号 H01L29/06
代理机构 代理人
主权项
地址 Boise ID US