发明名称 SEMICONDUCTOR DEVICE
摘要 A semiconductor device includes a first semiconductor layer of a first conductivity type formed on one side of a semiconductor substrate; a second semiconductor layer of a second conductivity type formed on the first semiconductor layer; a third semiconductor layer of the first conductivity type formed on the second semiconductor layer; an opening part formed by removing part of the first to third semiconductor layers; a gate insulating film formed so as to cover an inner wall of the opening part; a gate electrode formed inside the opening part via the gate insulating film; a source electrode formed on a surface of the third semiconductor layer; a drain electrode connected to a part corresponding to the gate electrode on another side of the semiconductor substrate; and a fourth electrode formed on the another side of the semiconductor substrate at a part corresponding to the source electrode.
申请公布号 US2017104098(A1) 申请公布日期 2017.04.13
申请号 US201615386004 申请日期 2016.12.21
申请人 FUJITSU LIMITED 发明人 OHKI Toshihiro;NISHIMORI Masato;IMADA Tadahiro
分类号 H01L29/78;H01L29/66;H01L29/20;H01L29/417;H01L29/06;H01L29/08 主分类号 H01L29/78
代理机构 代理人
主权项 1. A semiconductor device comprising: a first semiconductor layer of a first conductivity type formed on one side of a semiconductor substrate having conductivity; a second semiconductor layer of a second conductivity type formed on the first semiconductor layer; a third semiconductor layer of the first conductivity type formed on the second semiconductor layer; an opening part formed by removing part of the third semiconductor layer, the second semiconductor layer, and the first semiconductor layer; a gate insulating film formed so as to cover an inner wall of the opening part; a gate electrode formed inside the opening part via the gate insulating film; a source electrode formed on a surface of the third semiconductor layer; a drain electrode connected to a part corresponding to the gate electrode on another side of the semiconductor substrate; and a fourth electrode formed on the another side of the semiconductor substrate at a part corresponding to the source electrode.
地址 Kawasaki-shi JP