发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
A semiconductor device includes a first semiconductor layer of a first conductivity type formed on one side of a semiconductor substrate; a second semiconductor layer of a second conductivity type formed on the first semiconductor layer; a third semiconductor layer of the first conductivity type formed on the second semiconductor layer; an opening part formed by removing part of the first to third semiconductor layers; a gate insulating film formed so as to cover an inner wall of the opening part; a gate electrode formed inside the opening part via the gate insulating film; a source electrode formed on a surface of the third semiconductor layer; a drain electrode connected to a part corresponding to the gate electrode on another side of the semiconductor substrate; and a fourth electrode formed on the another side of the semiconductor substrate at a part corresponding to the source electrode. |
申请公布号 |
US2017104098(A1) |
申请公布日期 |
2017.04.13 |
申请号 |
US201615386004 |
申请日期 |
2016.12.21 |
申请人 |
FUJITSU LIMITED |
发明人 |
OHKI Toshihiro;NISHIMORI Masato;IMADA Tadahiro |
分类号 |
H01L29/78;H01L29/66;H01L29/20;H01L29/417;H01L29/06;H01L29/08 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a first semiconductor layer of a first conductivity type formed on one side of a semiconductor substrate having conductivity; a second semiconductor layer of a second conductivity type formed on the first semiconductor layer; a third semiconductor layer of the first conductivity type formed on the second semiconductor layer; an opening part formed by removing part of the third semiconductor layer, the second semiconductor layer, and the first semiconductor layer; a gate insulating film formed so as to cover an inner wall of the opening part; a gate electrode formed inside the opening part via the gate insulating film; a source electrode formed on a surface of the third semiconductor layer; a drain electrode connected to a part corresponding to the gate electrode on another side of the semiconductor substrate; and a fourth electrode formed on the another side of the semiconductor substrate at a part corresponding to the source electrode. |
地址 |
Kawasaki-shi JP |