| 发明名称 |
Spectroscopic Instrument |
| 摘要 |
The invention provides a spectroscopic instrument, which comprises a projecting optical system for projecting a projecting light emitted from a light source, a photodetecting optical system for receiving a reflection light from an object to be measured and for guiding to a photodetection member, and a spectroscope for detecting a condition of the object to be measured based on the reflection light as received by the photodetection member, wherein the projecting optical system and the photodetecting optical system have a projecting system chromatic aberration decreasing component and a photodetecting system chromatic aberration decreasing component which eliminate chromatic aberrations, respectively. |
| 申请公布号 |
US2017102265(A1) |
申请公布日期 |
2017.04.13 |
| 申请号 |
US201615284886 |
申请日期 |
2016.10.04 |
| 申请人 |
TOPCON Corporation |
发明人 |
Yuasa Taichi |
| 分类号 |
G01J3/02;G02B5/10;G01N21/27;G01J3/10;G01J3/42;G02B27/00;G02B13/18 |
主分类号 |
G01J3/02 |
| 代理机构 |
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代理人 |
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| 主权项 |
1. A spectroscopic instrument comprising: a projecting optical system for projecting a projecting light emitted from a light source, a photodetecting optical system for receiving a reflection light from an object to be measured and for guiding to a photodetection member, and a spectroscope for detecting a condition of said object to be measured based on said reflection light as received by said photodetection member, wherein said projecting optical system and said photodetecting optical system have a projecting system chromatic aberration decreasing component and a photodetecting system chromatic aberration decreasing component which eliminate chromatic aberrations, respectively. |
| 地址 |
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