发明名称 Semiconductor device having a fuse element
摘要 A portion-to-be-melted of a fuse is surrounded by plates, so that heat to be generated in a meltdown portion of the fuse under current supply can be confined or accumulated in the vicinity of the meltdown portion of the fuse. This makes it possible to facilitate meltdown of the fuse. The meltdown portion of the fuse in a folded form, rather than in a single here a fuse composed of a straight-line form, is more successful in readily concentrating the heat generated in the fuse under current supply into the meltdown portion, and in further facilitating the meltdown of the fuse.
申请公布号 US9620449(B2) 申请公布日期 2017.04.11
申请号 US201514878216 申请日期 2015.10.08
申请人 RENESAS ELECTRONICS CORPORATION 发明人 Ueda Takehiro
分类号 H01L27/10;H01L23/525;H01L23/34;H01L23/528;H01L23/532 主分类号 H01L27/10
代理机构 Young & Thompson 代理人 Young & Thompson
主权项 1. A semiconductor device, comprising: a substrate; an insulating layer formed over the substrate; a first conductive plate formed in the insulating layer and formed at a first wiring layer; a fuse element formed in the insulating layer and formed at a second wiring layer, the second wiring layer being one level above the first wiring layer; and a second conductive plate formed in the insulating layer and formed at a third wiring layer, the third wiring layer being one level above the second wiring layer; wherein the fuse element includes copper, wherein the fuse element is brought into a blow state by a current supplied thereto, wherein the fuse element has a first portion including a meltdown portion and a second portion that is wider than the first portion, wherein the first portion is bent a plurality of times, wherein the first conductive plate is formed below the fuse element in a planar view, and wherein the second conductive plate is formed above the fuse element in the planar view.
地址 Tokyo JP