发明名称 Method and circuit for detection of a fault event
摘要 According to one embodiment of the present disclosure, a circuit includes a Correlated Electron Switch (CES) element and a programming circuit. The CES element includes a first input. The first input of the CES element is coupled to an input signal to be monitored. The CES element is programmed in a first impedance state. The programming circuit coupled to the CES element is configured to switch the CES element from the first impedance state to a second impedance state in response to a voltage transition on the input signal. The voltage transition indicates a fault event. The output element coupled to the first input of the CES element determines that the transition has occurred responsive to the CES element switching to the second impedance state.
申请公布号 US9621161(B1) 申请公布日期 2017.04.11
申请号 US201514980117 申请日期 2015.12.28
申请人 ARM Ltd. 发明人 Das Shidhartha;Savanth Anand;Bull David
分类号 H03K17/16;H03K19/003;H03K19/0175 主分类号 H03K17/16
代理机构 Berkeley Law & Technology Group, LLP 代理人 Berkeley Law & Technology Group, LLP
主权项 1. A circuit comprising: a Correlated Electron Switch (CES) element comprising a first input configured to receive an input signal, the CES element being in a first impedance state; a programming circuit coupled to the CES element and configured to switch the CES element from the first impedance state to a second impedance state in response to a transition on the input signal; and an output element coupled to the first input of the CES element to determine that the transition on the input signal has occurred when the CES element switches to the second impedance state, wherein the transition is due to a fault event, and wherein the fault event comprises an ageing-related timing failure, a single event upset, a voltage droop condition or a ground bounce condition, or a combination thereof.
地址 Cambridge GB