发明名称 |
Dual layer microelectromechanical systems device and method of manufacturing same |
摘要 |
Exemplary microelectromechanical system (MEMS) devices, and methods for fabricating such are disclosed. An exemplary method includes providing a silicon-on-insulator (SOI) substrate, wherein the SOI substrate includes a first silicon layer separated from a second silicon layer by an insulator layer; processing the first silicon layer to form a first structure layer of a MEMS device; bonding the first structure layer to a substrate; and processing the second silicon layer to form a second structure layer of the MEMS device. |
申请公布号 |
US9617147(B2) |
申请公布日期 |
2017.04.11 |
申请号 |
US201514685309 |
申请日期 |
2015.04.13 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Chu Chia-Hua;Cheng Chun-Wen;Lee Jiou-Kang;Liang Kai-Chih;Lin Chung-Hsien;Lee Te-Hao |
分类号 |
H01L21/00;B81C1/00 |
主分类号 |
H01L21/00 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method comprising:
providing a substrate having a first semiconductor material layer, a second semiconductor material layer, and an insulator layer between the first and second semiconductor material layers; processing the first semiconductor material layer to form a first structure layer of a MEMS device, wherein processing the first semiconductor material layer to form the first structure layer includes:
forming a first trench within the first semiconductor material layer;forming a dielectric material layer within the first trench; andforming a first conductive layer within the first trench; and processing the second semiconductor material layer to form a second structure layer of the MEMS device; and removing the first conductive layer from the first trench prior to processing the second semiconductor material layer. |
地址 |
Hsin-Chu TW |