发明名称 Dual layer microelectromechanical systems device and method of manufacturing same
摘要 Exemplary microelectromechanical system (MEMS) devices, and methods for fabricating such are disclosed. An exemplary method includes providing a silicon-on-insulator (SOI) substrate, wherein the SOI substrate includes a first silicon layer separated from a second silicon layer by an insulator layer; processing the first silicon layer to form a first structure layer of a MEMS device; bonding the first structure layer to a substrate; and processing the second silicon layer to form a second structure layer of the MEMS device.
申请公布号 US9617147(B2) 申请公布日期 2017.04.11
申请号 US201514685309 申请日期 2015.04.13
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chu Chia-Hua;Cheng Chun-Wen;Lee Jiou-Kang;Liang Kai-Chih;Lin Chung-Hsien;Lee Te-Hao
分类号 H01L21/00;B81C1/00 主分类号 H01L21/00
代理机构 Haynes and Boone, LLP 代理人 Haynes and Boone, LLP
主权项 1. A method comprising: providing a substrate having a first semiconductor material layer, a second semiconductor material layer, and an insulator layer between the first and second semiconductor material layers; processing the first semiconductor material layer to form a first structure layer of a MEMS device, wherein processing the first semiconductor material layer to form the first structure layer includes: forming a first trench within the first semiconductor material layer;forming a dielectric material layer within the first trench; andforming a first conductive layer within the first trench; and processing the second semiconductor material layer to form a second structure layer of the MEMS device; and removing the first conductive layer from the first trench prior to processing the second semiconductor material layer.
地址 Hsin-Chu TW