发明名称 Characterization and correction of voltage probe, current probe and cable
摘要 Responses of voltage and current probes are characterized or corrected. A voltage probe method includes measuring output of the voltage probe and a first output of a through, in response to an input signal applied to the through, with the voltage probe connected, measuring a second output of the through with the voltage probe disconnected, and characterizing the response of the voltage probe using the output of the voltage probe and the first and/or second outputs. A current probe method includes measuring output current of the current probe and first output current of a through, in response to an input signal applied to the through with the current probe connected in series, measuring second output current of the through with the current probe disconnected, and characterizing the response of the current probe using the output current of the current probe and the first and/or second output currents of the through.
申请公布号 US9618599(B2) 申请公布日期 2017.04.11
申请号 US201113247568 申请日期 2011.09.28
申请人 Keysight Technologies, Inc. 发明人 Dascher David
分类号 G01R35/00 主分类号 G01R35/00
代理机构 代理人
主权项 1. A method for at least one of characterizing and correcting a response of a voltage probe, the method comprising: measuring an output of the voltage probe and a first output of a through, in response to an input signal applied to the through, with the voltage probe physically connected to a probe point of the through, the voltage probe comprising a first point that makes physical contact with a signal to be measured and a second point that makes physical contact to ground; measuring a second output of the through in response to the input signal, with the voltage probe disconnected from the probe point; characterizing the response of the voltage probe, comprising determining a transfer function of the voltage probe based on the measured output of the voltage probe and the measured first output of the through; and correcting the transfer function of the voltage probe, comprising: generating a filter correction for the voltage probe responsive to the measured output of the voltage probe and the measured first output of the through, wherein generating the filter correction comprises defining an ideal frequency response of the voltage probe, the filter correction comprising the ideal frequency response divided by the transfer function of the voltage probe; andapplying the filter correction to an output of the voltage probe generated in response to connection of the voltage probe to a probed system.
地址 Santa Rose CA US