Test instrument probe with a pointed tip that is also capable of gripping

摘要

A test instrument probe that encompasses the dual alternate action of a point or a clamp-grip within the same probe. This probe has approximately the same dimensions as a conventional probe, and allows either the point or clamp action to be used without the necessity of removing the probe from the hand. This alternate action requires only using a thumb and finger pressure to change from a point to a clamp or the clamp to a point. One embodiment allows a clamp jaw opening of up to a nominal ¼ inch that is usually sufficient to grip onto the leads of an electronic component such as resistor, capacitor or integrated circuit pin. The probes are also designed so that when not in use, the two probes can be connected together by a snap-in action that minimizes the potential loss of a probe and importantly allows the points to become safely enclosed to minimize a sharp point hazard.

主权项

1. A test instrument probe comprising:
a body; a split shaft assembly in said body, said split shaft assembly including a pair of substantially identical shaft halves normally biased together to form a point at a front end thereof, each shaft halve including a tab portion extending through an aperture in the other shaft halve, wherein when said tab portions are pressed together, said shaft halves are urged apart and said point opens to form a clamp for releasable capture of a lead on a device under test, and when said tab portions are released, said shaft halves return together to form a point.