发明名称 Method for improved growth of two-dimensional transition metal dichalcogenides
摘要 Processes for controlling the growth and thickness of two-dimensional transition metal dichalcogenides are provided. The process modifies an insulator substrate surface with an electron or ion beam to create charged areas on the substrate surface. The treated surface allows for hydroxylation of the charged species which serves as nucleation sites for the seed particles during chemical vapor deposition that promotes growth of thin layers of transition metal dichalcogenides.
申请公布号 US9620665(B1) 申请公布日期 2017.04.11
申请号 US201615184008 申请日期 2016.06.16
申请人 The United States of America as Represented by the Secretary of the Army 发明人 Bartolucci Stephen F.;Kaplan Daniel B.
分类号 H01L21/02;H01L29/786;H01L31/18;H01L29/66 主分类号 H01L21/02
代理机构 代理人 Wang Lisa H.
主权项 1. A method for controlled growth of transition metal dichalcogenides (TMD) comprising applying an electron or focused ion beam to an insulator surface to produce a charged area; exposing the insulator surface to water molecules wherein the charged area comprises hydroxyl groups; and depositing the TMD at a thickness of about 0.7 nm to 2.1 nm on said insulator surface using a chemical vapor deposition process.
地址 Washington DC US