Determining categories for memory fail conditions

摘要

Embodiments of the present invention provide methods, program products, and systems for testing a memory cell arrangement. Embodiments of the present invention can determine categories of memory fail conditions by checking memory cells of with a sequence of test parameter configurations for a malfunction using test parameters, storing for test parameter configurations for which a malfunction is detected, and assigning the respective test parameter configuration with a bit fail count comprising the number of malfunctioning memory cells. Embodiments of the present invention can be used to create a relational data structure representing test parameter configurations and can combine one or more test parameter configurations and can create a representation of the bit fail counts of the respective test parameter configurations.

主权项

1. A computer-implemented method comprising:
checking one or more memory cells for a malfunction; creating a relational data structure comprising a plurality of interlinked nodes and a root node such that each test parameter configuration of a set of test parameter configurations for which a malfunction has been detected is represented by a path, wherein test parameters associated with the test parameter configurations are assigned to one or more nodes of the plurality of interlinked nodes of the path according to a defined order starting from the root node, wherein each path is assigned a detected bit fail count for the path's respective test parameter configuration; combining one or more segments of the relational data structure according to a predefined rule for obtaining one or more test groups; creating a representation of the bit fail counts of the respective test groups; applying a filter to the relational data structure including the test groups in order to identify test parameter configurations categories to be further analyzed; storing, for each test parameter configurations for which a malfunction is detected, a bit fail map comprising information about a spatial distribution pattern of the malfunctioning memory cells; and determining a spatial distribution pattern of memory cells to be further analyzed using the parameter configuration categories to be further analyzed and the bit fail map.