发明名称 |
Backside illuminated image sensor structure |
摘要 |
Backside illuminated image sensor structures are provided. The backside illuminated image sensor structure includes a device substrate having a frontside and a backside and pixels formed at the frontside of the substrate. The backside illuminated image sensor structure further includes a metal element formed in a dielectric layer over the backside of the substrate and a color filter layer formed over the dielectric layer. In addition, the metal element is configured to form a light blocking area in the device substrate and is made of copper. |
申请公布号 |
US9620550(B2) |
申请公布日期 |
2017.04.11 |
申请号 |
US201514935861 |
申请日期 |
2015.11.09 |
申请人 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
发明人 |
Chang Hung-Chang;Hsu Chun-Yuan;Chen Chien-Chung;Lin Yung-Hsieh |
分类号 |
H01L27/146;H01L31/0232;H01L31/18 |
主分类号 |
H01L27/146 |
代理机构 |
Birch, Stewart, Kolasch & Birch, LLP |
代理人 |
Birch, Stewart, Kolasch & Birch, LLP |
主权项 |
1. A backside illuminated image sensor structure comprising:
a device substrate having a frontside and a backside; a plurality of pixels formed at the frontside of the device substrate and exposed from the backside of the device substrate; a dielectric layer formed on the backside of the device substrate and in direct contact with the pixels; a metal element embedded in the dielectric layer; and a color filter layer formed over the dielectric layer, wherein the metal element is made of copper and is in direct contact with the device substrate. |
地址 |
Hsinchu TW |