发明名称 Backside illuminated image sensor structure
摘要 Backside illuminated image sensor structures are provided. The backside illuminated image sensor structure includes a device substrate having a frontside and a backside and pixels formed at the frontside of the substrate. The backside illuminated image sensor structure further includes a metal element formed in a dielectric layer over the backside of the substrate and a color filter layer formed over the dielectric layer. In addition, the metal element is configured to form a light blocking area in the device substrate and is made of copper.
申请公布号 US9620550(B2) 申请公布日期 2017.04.11
申请号 US201514935861 申请日期 2015.11.09
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Chang Hung-Chang;Hsu Chun-Yuan;Chen Chien-Chung;Lin Yung-Hsieh
分类号 H01L27/146;H01L31/0232;H01L31/18 主分类号 H01L27/146
代理机构 Birch, Stewart, Kolasch & Birch, LLP 代理人 Birch, Stewart, Kolasch & Birch, LLP
主权项 1. A backside illuminated image sensor structure comprising: a device substrate having a frontside and a backside; a plurality of pixels formed at the frontside of the device substrate and exposed from the backside of the device substrate; a dielectric layer formed on the backside of the device substrate and in direct contact with the pixels; a metal element embedded in the dielectric layer; and a color filter layer formed over the dielectric layer, wherein the metal element is made of copper and is in direct contact with the device substrate.
地址 Hsinchu TW