发明名称 |
Vertical semiconductor device |
摘要 |
A vertical semiconductor device includes a channel structure extending from a substrate in a first direction perpendicular to an upper surface of the substrate, and a ground selection line, word lines, and a string selection line sequentially formed on a side surface of the channel structure in the first direction to be separated from one another. The channel structure includes a protruding region formed in a side wall portion of the channel structure between the ground selection line and the upper surface of the substrate, the protruding region protruding in a horizontal direction perpendicular to the first direction. |
申请公布号 |
US9620511(B2) |
申请公布日期 |
2017.04.11 |
申请号 |
US201414267909 |
申请日期 |
2014.05.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Lee Jae-goo;Park Young-woo;Park Jin-taek |
分类号 |
H01L29/66;H01L21/336;H01L27/112;H01L29/78;H01L29/788;H01L29/792;H01L27/1157;H01L27/11582;H01L27/11524;H01L27/11556 |
主分类号 |
H01L29/66 |
代理机构 |
Muir Patent Law, PLLC |
代理人 |
Muir Patent Law, PLLC |
主权项 |
1. A vertical semiconductor device comprising:
a first etch stop layer formed on a substrate; a ground selection line, word lines, and a string selection line sequentially formed on the first etch stop layer to be separated from one another in a first direction perpendicular to an upper surface of the substrate; and a channel structure contacting the upper surface of the substrate by penetrating the first etch stop layer, the ground selection line, the word lines, and the string selection line, wherein a portion of the channel structure penetrating the first etch stop layer protrudes in a horizontal direction, wherein the first etch stop layer includes a metal, and wherein a first width of the channel structure in the protruding region in the horizontal direction is larger than a second width of the channel structure in the horizontal direction located on a same level as the ground selection line. |
地址 |
Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do KR |