发明名称 Vertical semiconductor device
摘要 A vertical semiconductor device includes a channel structure extending from a substrate in a first direction perpendicular to an upper surface of the substrate, and a ground selection line, word lines, and a string selection line sequentially formed on a side surface of the channel structure in the first direction to be separated from one another. The channel structure includes a protruding region formed in a side wall portion of the channel structure between the ground selection line and the upper surface of the substrate, the protruding region protruding in a horizontal direction perpendicular to the first direction.
申请公布号 US9620511(B2) 申请公布日期 2017.04.11
申请号 US201414267909 申请日期 2014.05.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Lee Jae-goo;Park Young-woo;Park Jin-taek
分类号 H01L29/66;H01L21/336;H01L27/112;H01L29/78;H01L29/788;H01L29/792;H01L27/1157;H01L27/11582;H01L27/11524;H01L27/11556 主分类号 H01L29/66
代理机构 Muir Patent Law, PLLC 代理人 Muir Patent Law, PLLC
主权项 1. A vertical semiconductor device comprising: a first etch stop layer formed on a substrate; a ground selection line, word lines, and a string selection line sequentially formed on the first etch stop layer to be separated from one another in a first direction perpendicular to an upper surface of the substrate; and a channel structure contacting the upper surface of the substrate by penetrating the first etch stop layer, the ground selection line, the word lines, and the string selection line, wherein a portion of the channel structure penetrating the first etch stop layer protrudes in a horizontal direction, wherein the first etch stop layer includes a metal, and wherein a first width of the channel structure in the protruding region in the horizontal direction is larger than a second width of the channel structure in the horizontal direction located on a same level as the ground selection line.
地址 Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do KR