发明名称 COATED CUTTING TOOL AND METHOD FOR PRODUCING THE SAME
摘要 An embodiment of the invention provides a coated cutting tool having a base material and a hard coating, in which: the hard coating is formed from a nitride or a carbonitride having an Al content of from 50 at. % to 68 at. %, a Cr content of from 20 at. % to 46 at. %, and an Si content of from 4 at. % to 15 at. %, relative to the total amount of metal (including semimetal) elements, and when the total of metal (including semimetal) elements, nitrogen, oxygen, and carbon is designated as 100 at. %, the atomic percentage (at. %) A of metal (including semimetal) elements and the atomic percentage (at. %) B of nitrogen satisfy the relationship 1.03≦B/A≦1.07; and, in an intensity profile obtained from an X-ray diffraction pattern or a selected area diffraction pattern of a transmission electron microscope, an intensity of a peak from the (200) plane or the (111) plane of a face-centered cubic lattice structure exhibits the maximum intensity.
申请公布号 US2017096733(A1) 申请公布日期 2017.04.06
申请号 US201515125969 申请日期 2015.03.18
申请人 HITACHI METALS, LTD. ;MITSUBISHI HITACHI TOOL ENGINEERING, LTD. 发明人 SASAKI Tomoya;INOUE Kenichi
分类号 C23C14/06;C23C14/32 主分类号 C23C14/06
代理机构 代理人
主权项 1. A coated cutting tool, comprising a base material and a hard coating disposed on a surface of the base material, wherein: the hard coating is formed from a nitride or a carbonitride having an aluminum (Al) content of from 50 at. % to 68 at. %, a chromium (Cr) content of from 20 at. % to 46 at. %, and a silicon (Si) content of from 4 at. % to 15 at. %, with respect to a total amount of metal (including semimetal) elements, and when a total of metal (including semimetal) elements, nitrogen, oxygen, and carbon is designated as 100 at. %, an atomic percentage (at. %) A of metal (including semimetal) elements and an atomic percentage (at. %) B of nitrogen satisfy the relationship 1.03≦B/A≦1.07; and in an intensity profile obtained from an X-ray diffraction pattern or a selected area diffraction pattern of a transmission electron microscope, an intensity of a peak from a (200) plane or a (111) plane of a face-centered cubic lattice structure exhibits a maximum intensity.
地址 Minato-ku, Tokyo JP
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