发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
A semiconductor device includes a substrate, a semiconductor fin, a gate stack, and an epitaxy structure. The semiconductor fin is disposed in the substrate. A portion of the semiconductor fin is protruded from the substrate. The gate stack is disposed over the portion of the semiconductor fin protruded from the substrate. The epitaxy structure is disposed on the substrate and adjacent to the gate stack. The epitaxy structure has a top surface facing away the substrate, and the top surface has at least one curved portion having a radius of curvature ranging from about 5 nm to about 20 nm. |
申请公布号 |
US2017098698(A1) |
申请公布日期 |
2017.04.06 |
申请号 |
US201615381032 |
申请日期 |
2016.12.15 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LO Wei-Yang;CHEN Shih-Hao;LIN Mu-Tsang;CHENG Tung-Wen |
分类号 |
H01L29/66;H01L29/08;H01L21/3065;H01L29/78;H01L21/306 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a semiconductor device, comprising:
forming a semiconductor fin in a substrate; forming a gate stack over the semiconductor fin, wherein the gate stack exposes a portion of the semiconductor fin; removing the portion of the semiconductor fin exposed by the gate stack; and forming and shaping an epitaxy structure at the position of the removed semiconductor fin. |
地址 |
Hsinchu TW |