| 发明名称 |
TIME OF FLIGHT MASS SPECTROMETER |
| 摘要 |
A time of flight (“TOF”) mass spectrometer including: an ion source configured to produce ions having a plurality of m/z values; a detector for detecting ions produced by the ion source; a tilt correction device located along a portion of a reference ion flight path extending from the ion source to a planar surface of the detector; wherein the tilt correction device includes tilt correction electrodes configured to generate at least one dipole electric field across the reference ion flight path, the at least one dipole electric field being configured to tilt an isochronous plane of ions produced by the ion source so as to correct a previous angular misalignment between the isochronous plane and the planar surface of the detector. |
| 申请公布号 |
US2017098533(A1) |
申请公布日期 |
2017.04.06 |
| 申请号 |
US201615276876 |
申请日期 |
2016.09.27 |
| 申请人 |
SHIMADZU CORPORATION |
发明人 |
STEWART Hamish Ian;GILL Matthew;GILES Roger |
| 分类号 |
H01J49/06;H01J49/40 |
主分类号 |
H01J49/06 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A time of flight (“TOF”) mass spectrometer including:
an ion source configured to produce ions having a plurality of m/z values; a detector for detecting ions produced by the ion source; a tilt correction device located along a portion of a reference ion flight path extending from the ion source to a planar surface of the detector; wherein the tilt correction device includes tilt correction electrodes configured to generate at least one dipole electric field across the reference ion flight path, the at least one dipole electric field being configured to tilt an isochronous plane of ions produced by the ion source so as to correct a previous angular misalignment between the isochronous plane and the planar surface of the detector. |
| 地址 |
Kyoto JP |
