发明名称 INTERCONNECTION STRUCTURE, FABRICATING METHOD THEREOF, AND SEMICONDUCTOR DEVICE USING THE SAME
摘要 A semiconductor device includes a semiconductor substrate, an epitaxy structure present in the semiconductor substrate, and a silicide present on a textured surface of the epitaxy structure. A plurality of sputter ions are present between the silicide and the epitaxy structure. Since the surface of the epitaxy structure is textured, the contact area provided by the silicide is increased accordingly, thus the resistance of a interconnection structure in the semiconductor device is reduced.
申请公布号 US2017098613(A1) 申请公布日期 2017.04.06
申请号 US201615382492 申请日期 2016.12.16
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN Yu-Hung;LIU Chi-Wen;TSENG Horng-Huei
分类号 H01L23/532;H01L21/768;H01L21/3065;H01L23/528 主分类号 H01L23/532
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor substrate; an epitaxy structure in the semiconductor substrate and having a textured surface; and a conductor on the textured surface of the epitaxy structure.
地址 Hsinchu TW