| 摘要 |
An attraction state inspection device includes a diffusion member that is disposed inside a nozzle group in which a plurality of nozzles that attract parts are disposed, and transmits incident light while diffusing the light, an image pickup unit that is disposed on a side of the nozzle group apart from the diffusion member in a first direction, picks up an image of a part that is attracted by one nozzle positioned in the first direction with respect to the diffusion member, from among the plurality of nozzles constituting the nozzle group, against a background of the diffusion member, and obtains an image of the part, an irradiation unit that is disposed opposite the image pickup unit with the diffusion member interposed therebetween, and radiates light toward the nozzle group, and an inspection unit that inspects an attraction state of the part attracted by the one nozzle on the basis of the image of the part picked up by the image pickup unit. |
