发明名称 Methods and apparatus to detect a conductive object
摘要 A method and apparatus scan a first capacitive sensor element that is located in a first scan region for a presence of a conductive object and then scan a second capacitive sensor element that is located in a second scan region for the presence of the conductive object. The scan of the first capacitive sensor element includes applying a ground voltage to a ground element through the second capacitive sensor element, the ground element located in the first scan region.
申请公布号 US9612265(B1) 申请公布日期 2017.04.04
申请号 US201113242703 申请日期 2011.09.23
申请人 Cypress Semiconductor Corporation 发明人 Hoshtanar Oleksandr
分类号 G01R27/26;G01R17/16;G01R1/30;G01R1/067;G01R1/073;G01R1/18;G01Q70/16 主分类号 G01R27/26
代理机构 代理人
主权项 1. A method comprising: scanning a first scan region to determine a mutual capacitance indicative of a presence of a conductive object, the mutual capacitance formed between a first capacitive sensor electrode and a third capacitive sensor electrode located in the first scan region, wherein within at least one of the first capacitive sensor electrode and the third capacitive sensor electrode comprises an open interior area; applying, concurrent with scanning the first scan region, a ground voltage to a ground electrode located at least partially within the open interior area, wherein the ground voltage is applied to the ground electrode using a second capacitive electrode, wherein the first capacitive sensor electrode, the second capacitive sensor electrode, and the third capacitive sensor electrode are disposed in a same plane of a substrate layer; and detecting the presence of the conductive object using the determined mutual capacitance.
地址 San Jose CA US