发明名称 |
Symmetric tunnel field effect transistor |
摘要 |
The present disclosure relates to semiconductor structures and, more particularly, to a symmetric tunnel field effect transistor and methods of manufacture. The structure includes a gate structure including a source region and a drain region both of which comprise a doped VO2 region. |
申请公布号 |
US9613867(B2) |
申请公布日期 |
2017.04.04 |
申请号 |
US201615084137 |
申请日期 |
2016.03.29 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
Bajaj Mohit;Gundapaneni Suresh;Konar Aniruddha;Mavilla Narasimha R.;Murali Kota V. R. M.;Nowak Edward J. |
分类号 |
H01L21/8234;H01L21/3115;H01L29/66;H01L21/02;H01L21/8232;H01L29/786 |
主分类号 |
H01L21/8234 |
代理机构 |
Roberts Mlotkowski Safran Cole & Calderon, P.C. |
代理人 |
Meyers Steven;Calderon Andrew M.;Roberts Mlotkowski Safran Cole & Calderon, P.C. |
主权项 |
1. A method comprising:
depositing a doped VO2 region on a source side and a drain side of a device; and epitaxially growing semiconductor material for a source region and a drain region on the source side and the drain side of the device, respectively. |
地址 |
Armonk NY US |