发明名称 Symmetric tunnel field effect transistor
摘要 The present disclosure relates to semiconductor structures and, more particularly, to a symmetric tunnel field effect transistor and methods of manufacture. The structure includes a gate structure including a source region and a drain region both of which comprise a doped VO2 region.
申请公布号 US9613867(B2) 申请公布日期 2017.04.04
申请号 US201615084137 申请日期 2016.03.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 Bajaj Mohit;Gundapaneni Suresh;Konar Aniruddha;Mavilla Narasimha R.;Murali Kota V. R. M.;Nowak Edward J.
分类号 H01L21/8234;H01L21/3115;H01L29/66;H01L21/02;H01L21/8232;H01L29/786 主分类号 H01L21/8234
代理机构 Roberts Mlotkowski Safran Cole & Calderon, P.C. 代理人 Meyers Steven;Calderon Andrew M.;Roberts Mlotkowski Safran Cole & Calderon, P.C.
主权项 1. A method comprising: depositing a doped VO2 region on a source side and a drain side of a device; and epitaxially growing semiconductor material for a source region and a drain region on the source side and the drain side of the device, respectively.
地址 Armonk NY US