发明名称 Scanning electron microscope
摘要 An embodiment of the invention relates to a SEM enabling a surface analysis of a sample at a high throughput. The SEM has an electron gun, an irradiation unit, and a detector. The detector, as a first structure, includes an MCP, an anode, and a dynode. The dynode is set at a potential higher than a potential of an output face of the MCP and the anode is set at a potential higher than that of the dynode. The anode is disposed on the dynode side with respect to an intermediate position between the output face of the MCP and the dynode. The anode has an aperture for letting electrons from the output face of the MCP pass toward the dynode.
申请公布号 US9613781(B2) 申请公布日期 2017.04.04
申请号 US201615000305 申请日期 2016.01.19
申请人 HAMAMATSU PHOTONICS K.K. 发明人 Hayashi Masahiro
分类号 H01J37/26;H01J37/28;H01J37/04;H01J37/06 主分类号 H01J37/26
代理机构 Drinker Biddle & Reath LLP 代理人 Drinker Biddle & Reath LLP
主权项 1. A scanning electron microscope comprising: an electron gun for generating an electron beam; an irradiation unit for irradiating a sample with the electron beam while scanning the sample by moving a position of irradiation with the electron beam on the sample; and a detector for detecting electrons generated from the sample in accordance with the irradiation of the sample with the electron beam, wherein the detector includes: a micro-channel plate for multiplying secondary electrons generated in accordance with incidence of the electrons generated from the sample, the micro-channel plate having an input face located at a position of arrival of the electrons from the sample, and an output face opposing the input face and outputting the multiplied secondary electrons; a dynode disposed on the opposite side to the input face with respect to the output face and configured to multiply the secondary electrons outputted from the output face, the dynode being set at a potential higher than a potential of the output face; and an anode disposed in a space from the dynode to an intermediate position between the output face and the dynode and configured to collect the secondary electrons multiplied by the dynode, the anode having an aperture for letting the secondary electrons outputted from the output face, pass toward the dynode, the anode being set at a potential higher than the potential of the dynode.
地址 Hamamatsu-shi, Shizuoka JP