发明名称 |
Embedded transistor |
摘要 |
An embedded transistor for an electrical device, such as a DRAM memory cell, and a method of manufacture thereof is provided. A trench is formed in a substrate and a gate dielectric and a gate electrode formed in the trench of the substrate. Source/drain regions are formed in the substrate on opposing sides of the trench. In an embodiment, one of the source/drain regions is coupled to a storage node and the other source/drain region is coupled to a bit line. In this embodiment, the gate electrode may be coupled to a word line to form a DRAM memory cell. |
申请公布号 |
US9613965(B2) |
申请公布日期 |
2017.04.04 |
申请号 |
US201414507513 |
申请日期 |
2014.10.06 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Ting Yu-Wei;Huang Kuo-Ching |
分类号 |
H01L27/108;H01L29/06;H01L29/78;H01L29/66 |
主分类号 |
H01L27/108 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. A device comprising:
a substrate; a first recess and a second recess in the substrate, the first recess having a first bottom and the second recess having a second bottom, the first bottom and the second bottom being at a same first depth; a dielectric material filling the first recess; a gate dielectric along sidewalls and a bottom of the second recess; a gate electrode over the gate dielectric, the gate electrode having a top surface below an uppermost surface of the substrate; and source/drain regions in the substrate on opposing sides of the second recess. |
地址 |
Hsin-Chu TW |