发明名称 |
Method for forming electroless metal through via |
摘要 |
A method of making a substrate-through metal via having a high aspect ratio, in a semiconductor substrate, and a metal pattern on the substrate surface, includes providing a semiconductor substrate (wafer) and depositing poly-silicon on the substrate. The poly-silicon on the substrate surface is patterned by etching away unwanted portions. Then, Ni is selectively deposited on the poly-silicon by an electroless process. A via hole is made through the substrate, wherein the walls in the hole is subjected to the same processing as above. Cu is deposited on the Ni by a plating process. Line widths and spacings <10 μm are provided on both sides of the wafer. |
申请公布号 |
US9613863(B2) |
申请公布日期 |
2017.04.04 |
申请号 |
US201615040148 |
申请日期 |
2016.02.10 |
申请人 |
SILEX MICROSYSTEMS AB |
发明人 |
Ebefors Thorbjorn;Knutsson Henrik |
分类号 |
H01L21/44;H01L21/768;H01L21/288;H01L23/48;H01L21/02 |
主分类号 |
H01L21/44 |
代理机构 |
Young & Thompson |
代理人 |
Young & Thompson |
主权项 |
1. A method of making a substrate-through metal via having a high aspect ratio, in a semiconductor substrate, and a metal pattern on the substrate surface, comprising:
a) providing a semiconductor substrate (wafer); b) depositing poly-silicon on the substrate; c) patterning the poly-silicon on the substrate surface; d) selectively depositing Ni on the patterned poly-silicon by an electroless process, and e) providing an intermediate barrier layer of silicide SixNiy by silicidation of the deposited Ni through annealing; making a via hole through the substrate, wherein the walls in the hole is subjected to the same processing as in steps b)-d); depositing Cu on the Ni by a plating process. |
地址 |
Jarfalla SE |