发明名称 SEMICONDUCTOR DEVICE
摘要 A semiconductor device may include first conductive patterns and first interlayer insulating layers. Each of the first conductive patterns may include a first pad pattern extending in a first direction and first line patterns extending from the first pad pattern in a second direction crossing the first direction, widths of the first line patterns increasing as a distance from the first pad pattern decreases. The first conductive patterns and the first interlayer insulating layers may be stacked on top of each other.
申请公布号 US2017092655(A1) 申请公布日期 2017.03.30
申请号 US201615056074 申请日期 2016.02.29
申请人 SK hynix Inc. 发明人 JUNG Sung Wook
分类号 H01L27/115;H01L23/528 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor device comprising: first conductive patterns each including a first pad pattern extending in a first direction and first line patterns extending from the first pad pattern in a second direction crossing the first direction, widths of the first line patterns increasing as a distance from the first pad pattern decreases; and first interlayer insulating layers, wherein the first conductive patterns and the first interlayer insulating layers are alternately stacked on top of each other.
地址 Icheon-si Gyeonggi-do KR